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COMMUNICATION
Vu Thanh Tra, Jhih-Wei Chen, Po-Cheng Huang, Bo-Chao Huang, Ye Cao,
Chao-Hui Yeh, Heng-Jui Liu, Eugene A. Eliseev, Anna N. Morozovska, Jiunn-Yuan Lin,*
Yi-Chun Chen, Ming-Wen Chu, Po-Wen Chiu, Ya-Ping Chiu, Long-Qing Chen,
Chung-Lin Wu,* and Ying-Hao Chu
Ferroelectric Control of the Conduction at the LaAlO
3
/
SrTiO
3
Heterointerface
V. T. Tra, Prof. J.-Y. Lin
Institute of Physics
National Chiao Tung University
Hsinchu, 30010, Taiwan, ROC
E-mail: ago@nctu.edu.tw
J.-W. Chen, Prof. Y.-C. Chen, Prof. C.-L. Wu
Department of Physics
National Cheng Kung University
Tainan, 70101, Taiwan, ROC
E-mail: clwuphys@mail.ncku.edu.tw
P.-C. Huang, B.-C. Huang, Prof. Y.-P. Chiu
Department of Physics
National Sun Yat-Sen University
Kaohsiung, 80424, Taiwan, ROC
Y. Cao, Prof. L. Q. Chen
Department of Materials Science and Engineering
Pennsylvania State University
University Park, PA 16802, USA
DOI: 10.1002/adma.201300757
Complex oxide heterointerfaces have emerged as one of the
most exciting subjects in condensed matter, owing to their
unique physical properties and new possibilities for next-gen-
eration electronic devices.
[1,2]
In the push for practical applica-
tions, it is desirable to have the ability to modulate the interface
functionalities by an external stimulus. In this Communica-
tion, we propose a generic approach in which a functional
layer is inserted into the heterostructure to acquire non-vola-
tile control of the intriguing properties at oxide interfaces.
The LaAlO
3
/SrTiO
3
(LAO/STO) interface serves as a model
system in which a highly mobile quasi-two-dimensional elec-
tron gas (2DEG) forms between two band insulators,
[3,4]
exhib-
iting 2D superconductivity
[5]
and unusual magnetotransport
properties.
[6]
Although a modulation of the carrier density and
mobility of the LAO/STO interface has been achieved using
the electric field effect,
[7–9]
it is essential to extend the control
concepts to gain non-volatile and reversible capabilities for
practical applications. Recently, non-volatile modification of
the local conduction at the LAO/STO interface has been dem-
onstrated by scanning probe techniques.
[10–12]
Several possible
mechanisms have been proposed to explain this interesting
behavior based on the electrostatic effects attributed to either
induced ferroelectricity or surface charge.
[13,14]
In the study
reported here, we added a ferroelectric Pb(Zr
0.2
Ti
0.8
)O
3
(PZT)
layer near the LAO/STO interface. The ferroelectric polariza-
tion of the PZT layer serves as a control parameter to modulate
the 2DEG conducting behavior. The as-grown polarization ( P
up
state) leads to charge depletion and consequently low conduc-
tion. Switching the polarization direction ( P
down
state) results
in charge accumulation and enhances the conduction at the
LAO/STO interface. The origin of this modulation is attributed
to a change in the electronic structure due to the ferroelectric
polarization states, evidenced by X-ray photoelectron spectros-
copy (XPS) and cross-sectional scanning tunneling microscopy/
spectroscopy (XSTM/S). Control of the conduction at this oxide
interface suggests that the concept can be generalized for other
oxide systems to design functional interfaces.
In order to understand the influence of ferroelectricity on
the LAO/STO interface experimentally, we first carried out
electrical transport measurements on the heterostructure
( Figure 1a), in which the PZT layer with the spontaneous polar-
ization P
PZT
functions as a polarized dielectric slab to modu-
late the conduction of the LAO/STO heterointerface. Figure 1b
shows the sheet resistance versus temperature ( R– T curves)
of the PZT/LAO/STO samples with various PZT layer thick-
nesses (0–40 nm), while the LAO thickness was fixed (6 u.c.,
where u.c. stands for unit cell). The R– T curves for these sam-
ples show that the sheet resistance at room temperature is
low (ca. 23 k Ω/sq) and decreases with temperature, showing
metallic behavior. For the samples with PZT on top, the ferro-
electric effect sets in and the sheet resistance starts increasing
with PZT thickness, showing the strong impact of the intrinsic
C.-H. Yeh, Prof. P.-W. Chiu
Department of Electrical Engineering
National Tsing Hua University
Hsinchu, 30013,Taiwan, ROC
E. A. Eliseev, Prof. A. N. Morozovska
Institute of Problems of Material Sciences
and Institute of Physics
National Academy of Science of Ukraine
Kiev, Ukraine
Prof. M.-W. Chu
Center for Condensed Matter Sciences
National Taiwan University
Taipei, 10617, Taiwan, ROC
Dr. H.-J. Liu, Prof. Y. H. Chu
Department of Materials Science and Engineering
National Chiao Tung University
Hsinchu, 30010, Taiwan, ROC
Adv. Mater. 2013, 25, 3357–3364