1486 JOURNAL OF LIGHTWAVE TECHNOLOGY, VOL. 26, NO. 11, JUNE 1, 2008
Microwatt MOSLED Using SiO With Buried
Si Nanocrystals on Si Nano-Pillar Array
Gong-Ru Lin, Senior Member, IEEE, Member, OSA, Yi-Hao Pai, and Cheng-Tao Lin
Abstract—Microwatt light emission from a metal–oxide–semi-
conductor light-emitting diode (MOSLED) made by using SiO
film with buried Si nanocrystals on Si nano-pillar array is demon-
strated. The Si nano-pillar array obtained by drying the rapidly
self-aggregated Ni nano-dot-masked Si substrate exhibit size, as-
pect ratio, and density of 30 nm, 10, and 2.8 cm , re-
spectively. These high-aspect-ratio Si nano-pillar array helps to
enhance the Fowler–Nordheim tunneling-based carrier injection
and to facilitate the complete relaxation on total internal reflec-
tion, thus increasing the quantum efficiency by one order of mag-
nitude and improving the light extraction from the nano-rough-
ened device surface by three times at least. The light-emission in-
tensity, turn-on current and power-current slope of the MOSLED
are 0.2 mW/cm , 20-30 A, and 3 0.5 mW/A, respectively. At a
biased current of 400 A, the highest external quantum efficiency
is over 0.2% to obtain the maximum EL power of W. Com-
pared with the same device made on smooth Si substrate under a
power conversion ratio of 1 10 , such an output power perfor-
mance is enhanced by at least one order of magnitude.
Index Terms—Metal–oxide–semiconductor light-emitting
diode (MOSLED), plasma-enhanced chemical vapor deposition
(PECVD), Si nano-pillar array.
I. INTRODUCTION
P
LASMA-enhanced chemical vapor deposition (PECVD)-
grown Si-rich SiO or SiO with embedded Si nanocrys-
tals (referred hereafter as SiO -Si) of extremely high density
have been extensively investigated as a new class of light-emit-
ting material over decades [1]–[3]. The SiO -Si-based
metal–oxide–semiconductor light-emitting diode (MOSLED)
is indeed a potential candidate for next-generation opto-
electronic applications such as optical interconnect, optical
communication, and microdisplay panels. The advantages of
SiO -Si-based MOSLEDs include wavelength-tunable
and full-color emission, processing compatibility with other
MOS devices, system feasibility, and low cost of fabrication.
Electroluminescence (EL) from the SiO -Si film grown
by the anomalous PECVD recipe has previously been ob-
served [4]–[8]; however, the EL intensity and external quantum
efficiency is extremely low due to the nature of indirect re-
combination, the insulating property of the host oxide, and
Manuscript received Septeber 30, 2007; revised Febuary 26, 2008. This work
was supported in part by the National Science Council of Taiwan, R.O.C., and
U.S. Air-Force AOARD Office under Grants NSC96–2215-E-002–099 and FA
4869-07-1-4081.
The authors are with the Graduate Insistitute of Photonics and Optoelec-
tronics, Department of Electrical Engineering, National Taiwan University,
Taipei 106, Taiwan, R.O.C. (e-mail: grlin@ntu.edu.tw).
Color versions of one or more of the figures in this paper are available online
at http://ieeexplore.ieee.org.
Digital Object Identifier 10.1109/JLT.2008.922177
the tunneling dependent carrier injection. Versatile methods
were proposed to improve the efficiency of carrier injection
into nc-Si, which include the increasing on density of the
nc-Si embedded in SiO film, the decreasing thickness of
the nc-Si layer, and the bandgap engineering of the contact
metal. However, an efficient approach to improve the carrier
injection into the nc-Si embedded in the SiO film via the
Si nano-roughened surface-based electrode has never been
reported. Recently, the fabrication of the Si nano-pillar array
based on the electron-beam (E-beam) lithography and induc-
tively couple-plasma reactive ion etching (ICP-RIE) process
were introduced [9]–[12]. The Si nano-pillar array with its rod
size of -nm can be reproduced under the control of E-beam
lithography [12]. In addition, the self-assembled metallic
nano-dots have also emerged to function as nano-sensor for ei-
ther bio-photonics or etching-mask for nano-electronics. Ni has
been considered as an alternative to the other noble metals (Au
or Ag) for dry-etching the high-aspect-ratio Si nano-pillars on
Si substrate [12]–[15]. It is thus worthy discussing the external
quantum efficiency for light emission from a SiO -Si-based
MOSLED made on such a high-aspect-ratio Si nano-pillar
array on Si. In principle, there is an inherent limitation on the
quantum efficiency since the light extraction efficiency of most
conventional LEDs is limited by the total internal reflection
(TIR) of the emitting light from the active region of the LED,
which always occurs due to the large difference in the refractive
index at the interface between LED top-surface and air. [16] In
this letter, we demonstrate a novel SiO -Si MOSLED made
on the dense Si nano-pillar array to enhance both the carrier
injection and light extraction efficiencies, in which the Si
nano-pillars is fabricated by reactive-ion etching an oxide-cov-
ered Si substrate encapsulated with the self-assembled Ni
nano-dot mask. Anomalous photoluminescence (PL) spectra
of Si nano-pillars at visible and near-infrared spectral regions
are also investigated. Such a Si nano-pillar array is proposed to
enable a microwatt power emitting from the SiO -Si-based
MOSLED. The broadband electroluminescent (EL) spectrum
and improved turn-on characteristics of such a novel MOSLED,
with its external quantum efficiency increasing by enhanced
carrier injection and light-extracting mechanisms, are reported.
II. SAMPLE PREPARATION
To fabricate a SiO -based MOSLED on Si nano-pillar array,
the Si nano-pillar roughened Si substrate surface is obtained by
rapid thermal annealing a 5-nm-thick Ni film evaporated on a
20-nm-thick SiO layer covered Si substrate to induce self-ag-
gregation of a two-dimensional randomized Ni nano-dots mask
[17]. Subsequently, a large-area Si nano-pillar array with rod
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