A High Sensitivity PDCLC-based Electro-optic Modulator
for TFT Array Inspector
Jeoung-Yeon Hwang
1
, Junge Kyu Park
2
, Jong Sun Choi
3
, Hyungtak Kim
3
,
Jae-Hoon Kim
1,2
, and Chang-Jae Yu
1,2*
1
Dept. of Information Display Engineering, Hanyang University, Seoul, Korea
2
Dept. of Electronic Engineering, Hanyang University, Seoul, Korea
3
School of Electronic and Electrical Engineering, Hongik University, Seoul, Korea
Abstract
We proposed a high sensitive electro-optic modulator based on a
polymer-dispersed cholesteric liquid crystal (PDCLC) for the
TFT array inspector. Since the PDCLC is operated in a
reflective mode, the PDCLC-based inspection system is very
simple since a dielectric mirror, which is generally used in a
conventional TFT array inspector, is not required.
1. Introduction
Thin-film-transistor (TFT) liquid crystal displays (LCDs) have
the advantages of picture quality such as contrast, response, and
brightness. To reduce costs for the widespread use of TFT-LCDs,
the yield and throughput of the fabrication process of TFT arrays
must be improved. In order to increase yield and reduce costs, it is
necessary to test TFT arrays and detect defects during the
manufacturing process. A manufacturing the TFT-LCD with no
pixel defects is one of the important issues in the TFT-LCD
manufacturing industry. Therefore, the importance of the
efficiency enhancement on LCD production process has been
increasing and the ALDI (Automated LCD Defect Inspection)
system is demanded for this efficiency enhancement. There are
several established methods for various inspections [1-7]. In
general, the inspector shows a common electrode configuration in
a single substrate and the TFT array is acted as the other pixel
electrode for inspection. Most of them are noncontact methods
that use a two-dimensional electro-optic (EO) modulator and
detect the surface potential of the TFT array induced by phase
modulation [5, 6]. The positional resolution of the modulator is
required to level of several tens of micrometers. However, the
fringe electric field from the edges on the pixel electrode has
influence on liquid crystal configurations even at the neighboring
pixel regions. Thus, the EO variation penetrates into the
neighboring pixels. The variation is increased with increasing the
applied voltage and thus it gives rise to degrading the detection
sensitivity of the inspector. With increasing resolution TFT-LCD,
it is hard to detect a fine pitch pixel of TFT-LCDs by using the
modulator based on polymer-dispersed liquid crystal (PDLC) [6].
In this research, we propose a novel high sensitive EO
modulator based on the polymer-dispersed cholesteric liquid
crystal (PDCLC) for TFT array inspector. The non-contact
inspecting system for the novel light modulator based on PDLC is
shown in Fig. 1. A conventional PDLC-based modulator has to
require dielectric mirror. Conversely, the proposed modulator
based on PDCLC is operated in the reflected mode. Therefore, the
proposed modulator has the advantages of simple structure
without the dielectric mirror instead of conventional modulators.
2. Experimental
The polyimide (PI) alignment layer (RN1199, Nissan Chemical
industries Co.) for LC alignment was spin-coated on the indium-
tin-oxide (ITO) substrate. The layer was soft- baked to evaporate
solvent under 100 C for 10 min and then was hard-baked under
220 C for 1 hour 30 min. After rubbing the alignment layer, two
rubbed substrates were assembled in anti-parallel direction. The
mixtures for PDCLC device presented in this work are consisted of
CLCs with chiral dopant (R-811, Merck Co.) mixed in the nematic
LC MLC6608 (Merck Co.) and UV curable optical adhesive
prepolymer NOA65 (Norland Products Inc.). The CLCs and
prepolymer NOA65 are mixed in a ratio 50:50. The CLC mixtures
with the uniform cell gap of 15 μm were injected into the assembled
cells with antiparallel rubbed homogeneous alignment layer by
capillary action at a clearing temperature. And then, the UV light
was exposed for 90 min which uses different UV intensities with
0.05 mW/cm
2
, 8 mW/cm
2
, 32 mW/cm
2
. The samples were
measured by a polarizing optical microscope (POM) equipped with
a hot stage and computer program-assisted controller. The reflection
spectra were measured using Ocean Optics spectrometer equipped
with the spectroscopy operating software to calculate a variety of
color-space values from the reflection spectra.
Figure 1. Schematic non-contact testing system for novel
light modulator based on (a) cholesteric liquid crystal droplet
and (b) pillar structure.
3. Results and Discussion
Figure 2 shows the microscopic textures and image profiling
of a convention modulator based on PDLC and proposed
modulator based on PDCLC which uses different UV intensities
with 0.05, 8, and 32 mW/cm
2
. The size of droplet on PDCLC
according to UV intensity is about 7.34 m (32 mW/cm
2
), 14.4
m (8 mW/cm
2
), and 32.3 m (0.05 mW/cm
2
), respectively. As
UV intensity decreases, the size of droplet on PDCLC is
increased. Especially, the pillar structure on the PDCLC with the
lowest UV intensity (0.05 mW/cm
2
) is obtained as shown in Fig.
2(d). When the 50 V voltage on PDCLC based modulator is
applied, it have changed to focal conic state from planar state, and
then we can admit no pixel defect in TFT array substrate. The
light variation induced by the fringe effect electric field of the
edge on the ITO electrode is obtained by image processor as
shown in Fig. 2. As shown in Fig. 2(a), the variation value of the
modulator based on PDLC is about 20, and 33 m at 20, and 50 V
respectively. The variation is increased as increasing the size of
droplets in the PDCLC.
ISSN 0097-966X/13/4403-1341-$1.00 © 2013 SID
P-94 / J.-Y. Hwang
SID 2013 DIGEST • 1341