This content has been downloaded from IOPscience. Please scroll down to see the full text. Download details: IP Address: 137.53.244.29 This content was downloaded on 16/09/2014 at 08:45 Please note that terms and conditions apply. Study of silicon-silicon nitride interface properties on planar (1 0 0), planar (1 1 1) and textured surfaces using deep-level transient spectroscopy View the table of contents for this issue, or go to the journal homepage for more 2010 J. Phys. D: Appl. Phys. 43 485301 (http://iopscience.iop.org/0022-3727/43/48/485301) Home Search Collections Journals About Contact us My IOPscience