Early stages of cesium adsorption on the As-rich c „ 2 Ã 8 … reconstruction of GaAs„001…:
Adsorption sites and Cs-induced chemical bonds
C. Hogan,
1
D. Paget,
2
Y. Garreau,
3
M. Sauvage,
3
G. Onida,
4
L. Reining,
5
P. Chiaradia,
1
and V. Corradini
6
1
Dipartimento di Fisica and INFM, Universita ` di Roma ‘‘Tor Vergata,’’00133 Roma, Italy
2
Laboratoire de Physique de la Matie `re Condense ´e, Ecole Polytechnique, 91128 Palaiseau cedex, France
3
LURE, CNRS-MR-CEA, Ba ˆtiment 209d, Centre Universitaire Paris-sud, BP34, 91898 Orsay, France
4
Dipartimento di Fisica and INFM, Universita ` di Milano, Italy
5
Laboratoire des Solides Irradie ´s, UMR 7642 CNRS/CEA, Ecole Polytechnique, 91128 Palaiseau cedex, France
6
Dipartimento di Fisica and INFM, Universita ` di Modena, 1 Via G. Campi, 213/A I-41100, Modena, Italy
Received 4 June 2003; published 19 November 2003
We investigate the adsorption of Cs on the As-rich c (2 8)/(2 4) reconstruction of GaAs001 at low
coverages using a combination of theoretical and experimental techniques. Density-functional-theory local-
density-approximation total-energy calculations and x-ray diffraction experiments find only minimal Cs-
induced surface relaxation and identify three preferential adsorption sites within the partially disordered over-
layer. These sites are, in order of decreasing occupation probability, the arsenic dimer bridge D site, the gallium
dangling bond T
2
' site, and the arsenic T
3
trench site. Detailed analysis of the wave functions and electronic
charge densities allows us to clarify the bonding mechanisms at the three sites. At the gallium site, the bonding
is strongly ionic and involves significant charge transfer to a new Cs-induced state reminiscent of the p
z
orbital
of the gallium atom in the sp
2
configuration. In sharp contrast, at the arsenic sites, the charge transfer is
minimal and the bonding rather occurs through mixing with a relatively delocalized state of the clean surface.
The ionization energy decreases are estimated and compared for the three sites.
DOI: 10.1103/PhysRevB.68.205313 PACS numbers: 78.40.Fy, 78.68.+m, 73.20.At
I. INTRODUCTION
The interaction between alkali atoms and semiconductor
surfaces has long been the object of intensive fundamental
studies, because of technological applications related to the
lowering of the surface work function and because the ab-
sence of chemical reactions at the interface makes it a model
system. From an experimental point of view, such studies
have mostly concerned GaAs and silicon, using Auger spec-
troscopy and low-energy electron diffraction,
1–3
core level
spectroscopy,
4,5
electron loss spectroscopy,
6,7
scanning tun-
neling spectroscopy,
8
and x-ray diffraction.
9–11
Ab initio cal-
culations have been performed using Na adsorption on
GaAs110,
12
Cs adsorption on GaAs clusters simulating the
110 surface,
13
and K adsorption on Si001.
14
Among all these studies, only a very small fraction have
considered very-low-coverage conditions, for which the
alkali-alkali interactions are negligible as compared with
alkali-substrate interactions. In this regime, fundamental as-
pects of the latter interactions can be investigated in detail. In
order to investigate the adsorption on a microscopic scale, it
is first desirable to identify the adsorption sites and to evalu-
ate the displacement of substrate atoms induced by adsorp-
tion. It is of further interest to characterize the nature of the
chemical bond between the adatom and the surface, to deter-
mine the amount of charge transfer between the electroposi-
tive alkali and the solid, and to analyze the nature of the
alkali-induced surface dipole. For 001 and 011 surfaces of
III-V semiconductors such as GaAs, one may think that, due
to the presence of cations and anions at the surface, alkali
atoms should preferentially adsorb near the empty dangling
bonds of cation sites. This has been predicted using a reason-
ing based on a tight-binding treatment of the hybridization of
the outer s electron of the alkali and of the surface dangling
bond.
15
For Cs adsorption at the 110 cleavage face, using
scanning tunneling microscopy STM,
16
it has indeed been
found that, at very low coverage, Cs atoms adsorb near Ga
atoms. Calculations of adsorption of Na at the same surface
12
have shown that adsorption does not induce a breaking of
surface chemical bonds, but results in a derelaxation of sub-
strate atoms. The bonding between Na adatoms and substrate
gallium atoms occurs through hybridization of the outer s
alkali state and of the empty gallium dangling bond. The
alkali s electron is partially transferred into the Ga dangling
bonds, with only a weak perturbation of the latter. This trans-
fer produces a surface dipole which, together with the alkali-
induced change of surface dipole caused by the substrate
derelaxation, explains the lowering of the ionization energy.
For adsorption at the (2 1) reconstruction of the 001
surface of Si, the situation seems to be quite different. Using
x-ray diffraction,
10
it was found that the dimer site D and the
trench site T
3
are jointly populated, thus creating some dis-
order in the alkali overlayer. For the former site, the silicon
dimer bond seems to be broken, with a Si-Si distance close
to its bulk value. These results are at variance with the ones
found on the similar surface of germanium,
9
for which the
Ge-Ge distances do not change by more than 8%, and in
particular, the Ge dimer bonding length is essentially un-
changed. Calculations performed for the K/Si system
14
con-
clude that, at low coverage, the adatom region remains neu-
tral, so that the amount of charge transfer is limited. The
surface dipole originates from a polarization of the adatom
due to the Si-K mixing. The same conclusion is also reached
by a core level investigation for the same system.
17
PHYSICAL REVIEW B 68, 205313 2003
0163-1829/2003/6820/20531311/$20.00 ©2003 The American Physical Society 68 205313-1