HAL Id: lirmm-01253184 https://hal-lirmm.ccsd.cnrs.fr/lirmm-01253184 Submitted on 12 Jan 2016 HAL is a multi-disciplinary open access archive for the deposit and dissemination of sci- entifc research documents, whether they are pub- lished or not. The documents may come from teaching and research institutions in France or abroad, or from public or private research centers. L’archive ouverte pluridisciplinaire HAL, est destinée au dépôt et à la difusion de documents scientifques de niveau recherche, publiés ou non, émanant des établissements d’enseignement et de recherche français ou étrangers, des laboratoires publics ou privés. Analysing the Impact of Aging and Voltage Scaling under Neutron-induced Soft Error Rate in SRAM-based FPGAs Fernanda Lima Kastensmidt, Tonfat Jorge, Thiago Both, Paolo Rech, Gilson Wirth, Ricardo da Luz Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost To cite this version: Fernanda Lima Kastensmidt, Tonfat Jorge, Thiago Both, Paolo Rech, Gilson Wirth, et al.. Analysing the Impact of Aging and Voltage Scaling under Neutron-induced Soft Error Rate in SRAM-based FPGAs. ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2014, Berlin, Germany. lirmm-01253184