Citation: Alhussan, A.A.; Al-Dhaqm,
A.; Yafooz, W.M.S.; Emara, A.-H.M.;
Bin Abd Razak, S.; Khafaga, D.S. A
Unified Forensic Model Applicable to
the Database Forensics Field.
Electronics 2022, 11, 1347. https://
doi.org/10.3390/electronics11091347
Academic Editor: Prasan
Kumar Sahoo
Received: 12 March 2022
Accepted: 17 April 2022
Published: 23 April 2022
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electronics
Article
A Unified Forensic Model Applicable to the Database
Forensics Field
Amel Ali Alhussan
1
, Arafat Al-Dhaqm
2
, Wael M. S. Yafooz
3
, Abdel-Hamid M. Emara
3,4
,
Shukor Bin Abd Razak
2
and Doaa Sami Khafaga
1,
*
1
Department of Computer Sciences, College of Computer and Information Sciences,
Princess Nourah Bint Abdulrahman University, Riyadh 11671, Saudi Arabia; aaalhussan@pnu.edu.sa
2
School of Computing, Faculty of Engineering, Universiti Teknologi Malaysia (UTM),
Johor Skudai 813110, Malaysia; mrarafat1@utm.my (A.A.-D.); shukorar@utm.my (S.B.A.R.)
3
Department of Computer Science, College of Computer Science and Engineering, Taibah University,
Medina 42353, Saudi Arabia; wyafooz@taibahu.edu.sa (W.M.S.Y.); aemara@taibahu.edu.sa (A.-H.M.E.)
4
Department of Computers and Systems Engineering, Faculty of Engineering, Al-Azhar University,
Cairo 11884, Egypt
* Correspondence: dskhafga@pnu.edu.sa
Abstract: The Database Forensics Investigation (DBFI) field is focused on capturing and investi-
gating database incidents. DBFI is a subdomain of the digital forensics domain, which deals with
database files and dictionaries to identify, acquire, preserve, examine, analyze, reconstruct, present,
and document database incidents. Several frameworks and models have been offered for the DBFI
field in the literature. However, these specific models and frameworks have redundant investigation
processes and activities. Therefore, this study has two aims: (i) conducting a compressive survey
to discover the challenges and issues of the DBFI field and (ii) developing a Unified forensic model
for the database forensics field. To this end, the design science research (DSR) method was used
in this study. The results showed that the DBFI field suffers from many issues such as the lack
of standardization, multidimensional nature, heterogeneity, and ambiguity, making it complex for
those working in this domain. In addition, a model was proposed in this paper, called the Unified
Forensic Model (UFM), which consists of five main stages: initialization stage, acquiring stage,
investigation stage, restoring and recovering stage, and evaluation stage. Each stage has several
processes and activities. The applicability of UFM was evaluated from two perspectives: complete-
ness and implementation perspectives. UFM is a novel model covering all existing DBFI models
and comprises two new stages: the recovering and restoring stage and the evaluation stage. The
proposed UFM is so flexible that any forensic investigator could employ it easily when investigating
database incidents.
Keywords: database forensic; digital forensic; design science research; model
1. Introduction
Database Forensic Investigation (DBFI) is a branch of digital forensics that examines
database content to confirm database incidents. It is considered a significant field to
identify, detect, acquire, analyze, and reconstruct database incidents and reveal intruders’
activities [1]. It has suffered from several issues, which have resulted in it becoming a
heterogeneous, confusing, and unstructured domain. Examples of these issues include
a variety of database system infrastructures, the multidimensional nature of database
systems, and domain knowledge effectively being scattered in all directions. Various
database system infrastructures with multidimensional natures have enabled the DBFI
domain to address specific incidents. Therefore, each database management system (DBMS)
has a straightforward forensic investigation model/approach. Consequently, the issues of
different concepts and terminologies in the forensic investigation process and the scattering
Electronics 2022, 11, 1347. https://doi.org/10.3390/electronics11091347 https://www.mdpi.com/journal/electronics