Microstructure and magnetic properties of patterned nano crystalline zinc ferrite thin film fabricated by pulse laser deposition Jaison Joseph a, *, R.B. Tangsali b , V.P. Mahadevan Pillai c , R.J. Choudhary d , D.M. Phase d , V. Ganeshan d a Department of Physics, Government College, Khandola, Goa 403 107, India b Department of Physics, Goa University, Taleigao Plateau, Goa 403 206, India c Department of Optoelectronics, University of Kerala, Thiruvananthapuram, Kerala 695581, India d UGC-DAE-CSR, Indore, Madhya Pradesh 452 017, India A R T I C L E I N F O Article history: Received 12 June 2014 Received in revised form 17 October 2014 Accepted 27 October 2014 Available online 29 October 2014 Keywords: Thin films Laser deposition Microstructure Magnetic properties A B S T R A C T Patterned nano crystalline ZnFe 2 O 4 thin film was fabricated on quartz substrate by pulse laser deposition. XRD and Raman spectroscopic techniques were employed for structural characterization of the film. Silencing of a small number of prominent ferrite XRD peaks in thin film signify mild textured film growth. The observed XRD peak position swing with respect to the target material in thin film indicates formation of lateral strain in opposite directions during film growth. The thin film XRD peak position shift with target material data as reference is explained by suggesting an appropriate film growth model. Designated ferrite Raman emission peaks originated from film surface authenticates the stoichiometric and structural stability of ferrite material. AFM images indicate specific pattern formation with nanogranular morphology. Magnetic property measurements of the thin film revealed enhanced properties which are explained on the basis of texture, lattice strain, and surface features that are originated from patterned thin film growth. ã 2014 Elsevier Ltd. All rights reserved. 1. Introduction The Interest in ferrite thin films is derived from their potential applications in high-frequency electronics and information storage devices [1,2]. The physical properties of ferrites in thin film form may vary with respect to its bulk counterpart. Although properties of nano ferrites are fairly well understood in powder form, deposition factors do affect the microstructure of the film, which in turn characterize the properties of the material in thin film [3]. Most reported results showed an increase in coercivity and decrease in magnetization due to the nanocrystalline nature of the material in films [4]. Bulk zinc ferrite, having normal spinel structure and exhibit paramagnetic properties, show magnetic order in its nanoparticles at room temperature [5–7]. Similar observations of magnetization are reported in Zn ferrite thin films [8–11]. Nanocrystalline zinc ferrite material which had already gained interest due to its unique magnetic properties that differ substantially from its bulk counterpart find industrial applications in electronic component manufacture as a common ingredient for technologically important Ni–Zn and Mn–Zn mixed ferrites [12,13]. The miniaturization of electronic components compels the industry to seek favorable thin film magnetic properties for possible device fabrications. Any ferrite thin film growth process on amorphous substrates find instant industrial applications if compatible with integrated circuit technology. In process applications wherein magnetic oxides are to be integrated on to semiconducting materials, low processing temperature is a preferred prerequisite to avoid possible chemical reaction with metal atoms present in device structures. In comparison with other techniques, pulse laser deposition (PLD) provides increased atom mobility during film deposition owing to high kinetic energy of the vaporized material in laser plume. This helps in formation of homogeneous film microstructure, without any distortion of target stoichiometry. Further this technique may possibly lower the substrate processing temperature required for crystallization. To a certain extend magnetic properties of thin films are shaped on the basis of the microstructure evolved during film growth. Some growth parameters that affect the microstructure of the film are substrate temperature, thermal expansion coefficient, lattice * Corresponding author. Tel.: +91 8322412318; fax: +91 8322287718. E-mail address: jaisonjosephp@gmail.com (J. Joseph). http://dx.doi.org/10.1016/j.materresbull.2014.10.061 0025-5408/ ã 2014 Elsevier Ltd. All rights reserved. Materials Research Bulletin 61 (2014) 475–480 Contents lists available at ScienceDirect Materials Research Bulletin journal homepage: www.else vie r.com/locat e/mat resbu