Delft University of Technology Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT- MRAMs Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said DOI 10.1109/ITC44778.2020.9325258 Publication date 2021 Document Version Accepted author manuscript Published in 2020 IEEE International Test Conference, ITC 2020 Citation (APA) Wu, L., Rao, S., Taouil, M., Marinissen, E. J., Kar, G. S., & Hamdioui, S. (2021). Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs. In 2020 IEEE International Test Conference, ITC 2020 (pp. 1-10). [9325258] (Proceedings - International Test Conference; Vol. 2020- November). IEEE . https://doi.org/10.1109/ITC44778.2020.9325258 Important note To cite this publication, please use the final published version (if applicable). Please check the document version above. Copyright Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons. Takedown policy Please contact us and provide details if you believe this document breaches copyrights. We will remove access to the work immediately and investigate your claim. This work is downloaded from Delft University of Technology. For technical reasons the number of authors shown on this cover page is limited to a maximum of 10.