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2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim 1311
www.MaterialsViews.com
wileyonlinelibrary.com Adv. Funct. Mater. 2012, 22, 1311–1318
Alexander Alekseev,* Delei Chen, Evgeniy E. Tkalya, Marcos G. Ghislandi, Yuliya Syurik,
Oleg Ageev, Joachim Loos, and Gijsbertus de With
1. Introduction
The unique electrical, mechanical and other properties of
graphene
[1–3]
and its derivatives
[4,5]
make it important to investi-
gate the properties of polymer-based graphene composites. Dif-
ferent approaches for preparation and characterization of such
composites have been proposed recently.
[6–12]
Current state-of-
the-art situation in the area of graphene-polymer composites
has been described in several recent reviews.
[13–16]
The methods
of preparation of a filler and matrix and the
way of their mixing are of critical impor-
tance, since they determine the properties
of the composite. Among others, electrical
properties of composites attract great
attention due to the large area of possible
applications. Percolation behavior of con-
ductivity in graphene/polymer composites
has been revealed and analyzed by various
research groups.
[6,8,10–12]
Corresponding
to the widely accepted percolation theory,
charge transport inside the insulating
polymer/conductive filler composites
is executed through the conductive net-
work formed by the filler.
[17,18]
It means
that the local organization of graphene
sheets (GS) inside the polymer matrix is
responsible for the conductive properties
of the composite. Until now information
about the distribution of graphene sheets
inside the polymer was obtained mostly by electron micro-
scopy.
[6–12]
Scanning probe microscopy methods were used in
study of graphene/polymer composites only in few works.
[12]
In the present study we use electrical methods of scanning
probe microscopy (SPM) for analysis of the graphene network
inside a conductive graphene/polystyrene (PS) composite. It is
shown that the graphene sheets (GS), connected into the con-
ductive network and isolated ones, can be distinguished by
measurements of the same area with both conductive atomic
Local Organization of Graphene Network Inside Graphene/
Polymer Composites
The local electrical properties of a conductive graphene/polystyrene (PS)
composite sample are studied by scanning probe microscopy (SPM) applying
various methods for electrical properties investigation. We show that the
conductive graphene network can be separated from electrically isolated
graphene sheets (GS) by analyzing the same area with electrostatic force
microscopy (EFM) and conductive atomic force microscopy (C-AFM). EFM
is able to detect the graphene sheets below the sample surface with the
maximal depth of graphene detection up to ≈100 nm for a tip-sample poten-
tial difference of 3 V. To evaluate depth sensing capability of EFM, the novel
technique based on a combination of SPM and microtomy is utilized. Such a
technique provides 3D data of the GS distribution in the polymer matrix with
z-resolution on the order of ≈10 nm. Finally, we introduce a new method for
data correction for more precise 3D reconstruction, which takes into account
the height variations.
DOI: 10.1002/adfm.201101796
Dr. A. Alekseev
Laboratory of Materials and Interface Chemistry
Eindhoven University of Technology
Den Dolech 2, Eindhoven
5600 MB, The Netherlands
E-mail: alalrus@gmail.com
D. Chen, M. G. Ghislandi, Prof. G. de With
Laboratory of Materials and Interface Chemistry
Eindhoven University of Technology
Den Dolech 2, Eindhoven
5600 MB, The Netherlands
E. E. Tkalya
Department of Polymer Chemistry
Eindhoven University of Technology
Den Dolech 2, Eindhoven
5600 MB, The Netherlands
Y. Syurik, Prof. O. Ageev
Taganrog Institute of Technology
Shevchenko Street 2
Taganrog, 347928, Russia
Prof. J. Loos
School of Physics and Astronomy
Kelvin Nanocharacterisation Centre
and Scottish University Physics Alliance
University of Glasgow
University Avenue, Glasgow
G128QQ, UK