This is an author-deposited version published in: http://oatao.univ-toulouse.fr/ Eprints ID: 8355 To link to this article: DOI: 10.1109/TNS.2012.2222927 URL: http://dx.doi.org/10.1109/TNS.2012.2222927 To cite this version: Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Magnan, Pierre and Gaillardin, Marc and Virmontois, Cédric and Martin-Gonthier, Philippe and Molina, Romain and Corbière, Franck and Girard, Sylvain and Paillet, Philippe and Marcandella, Claude Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose. (2012) IEEE Transactions on Nuclear Science, vol. 59 (n° 6). pp. 2878-2887. ISSN 0018-9499 Open Archive Toulouse Archive Ouverte (OATAO) OATAO is an open access repository that collects the work of Toulouse researchers and makes it freely available over the web where possible. Any correspondence concerning this service should be sent to the repository administrator: staff-oatao@inp-toulouse.fr