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MEASUREMENT OF CHANNEL MOBILITY IN TOP CONTACT PENTACENE
ORGANIC THIN FILM TRANSISTORS
PRAVINA RAJPUT
1
& VINAY K. SINGH
2
1
Ph.D. Scholar, C.S.V.T.U. Bhilai, India
2
Associate Professor, G.E.C. Jagdalpur, India
ABSTRACT
A source voltage separation based method for the extracting the effective channel mobility in top contact pentacene
organic thin film transistor is developed. Using the measured source voltage appear across the source is extracted. The
new method facilitates mobility extraction in situations where the voltage appears across the source, making the mobility
extraction easier and more accurate
KEYWORDS: OTFT, Pentacene, Contact Resistance, Effective Channel Mobility
Received: Jun 08, 2020; Accepted: Jun 28, 2020; Published: Aug 19, 2020; Paper Id.: IJMPERDJUN2020814
INTRODUCTION
Organic thin film transistors (OTFT) are being actively developed for a number of potential applications like
sensors, inverters, radio frequency identification tags and displays on substrates such as glass, plastic, fabric and
even paper [1]-[4]. There are significant improvement in performance over the last two decade, there are a number
of challenging problems that still need to be addressed. Among them is high voltage required for operation of these
transistors. A reduction in insulator thickness and use of insulators with high dielectric constant are among the
potential approaches that are being explored to obtain low operating voltages [5]-[10]. Source resistance is one of
the major challenge in organic thin film transistor. As a result, it is important to obtain its accurate value of channel
mobility, so that factors contributing to it can be properly understood and managed. The method proposed in this
work uses to measure the floating electrode voltage and then extracted voltage underneath the source as describe in
Ref [11]. The Channel mobility is measured by subtraction of the source voltage from drain to source voltage.
DEVICE FABRICATION
Figure 1: Schematic of Top Contact Bottom Gate Pentacene OTFTs
Fabricated on PVP Dielectric.
Original Article
International Journal of Mechanical and Production
Engineering Research and Development (IJMPERD)
ISSN(P): 2249–6890; ISSN(E): 2249–8001
Vol. 10, Issue 3, Jun 2020, 8565–8570
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