Structural changes of silicon upon high-energy milling investigated by Raman spectroscopy This article has been downloaded from IOPscience. Please scroll down to see the full text article. 2008 J. Phys.: Condens. Matter 20 025205 (http://iopscience.iop.org/0953-8984/20/2/025205) Download details: IP Address: 192.33.126.163 The article was downloaded on 24/10/2011 at 14:52 Please note that terms and conditions apply. View the table of contents for this issue, or go to the journal homepage for more Home Search Collections Journals About Contact us My IOPscience