Investigation of High Z Components Doped in Polymeric Films, Using 2π Configuration X-Ray Fluorescence Technique Preeti B. Hammannavar and Blaise Lobo* Doping of a polymeric material involves incorporation of different reduction À oxidation agents into the host polymeric material, resulting in an increase in electrical conductivity, modification of optical properties and changes in microstructure of the polymeric material. The detection of high atomic number (Z) components in doped polymeric films is performed using Energy Dispersive X-ray Fluorescence (EDXRF) technique in 2 π geometrical configuration. In order to study K shell (K αβ ) X-rays emitted from the prepared films, thallium doped sodium iodide [NaI(Tl)] scintillator is used as the detector of X-rays and cobalt-57 radio-isotope is used as the source of low energy gamma rays. Initially, the calibration data is recorded considering the different known concentrations of high Z element in a host polymeric matrix. This involves the identification of the X-ray fluorescent peak of the metal/metal ion and use of stripping software to isolate the X-ray fluorescence spectrum. The area under the fluorescence peak is determined, at each concentration level of dopant/filler. A calibration plot of area under the fluorescence peak versus known concentration of high Z component in the dopant/filler is plotted. This helps in the determination of unknown amount of that particular high Z-component doped or filled in a host matrix. The different parameters involved in this measurement is discussed along with studies on polymeric composites doped with a salt/compound contain- ing high Z-components, namely bismuth subcarbonate in a host polymeric matrix (epoxy filled with graphite powder). 1. Introduction The extensive use of heavy metals in medicine, industry and agriculture has attracted the attention of environmental researchers. Plastic, coal, and dye industries are the main sources which pollute soil, water and air, which can be considered as a growing threat to humanity, due to their effects on human health and the environment. [1] Metals like arsenic, cadmium, chromium, lead and mercury show a high degree of toxicity, and they are kept under priority watch by environmental scientists. Thus, the increase in concentration of these medium and high Z components in the environ- ment (For example: air, soil, plants and water bodies) is a matter of serious environmental concern. X-ray fluorescence (XRF) [2] offers a technique to qualitatively and quantitatively probe materials contain- ing such contaminants, in order to deter- mine the elemental constituent of the material, starting from trace levels (parts per million) up to 100%. Radioactive sources of gamma rays are widely used in different applications, like for example, nuclear medicine and preser- vation of agricultural produce. Gamma radiation shielding is important to protect personnel managing such radiation facili- ties (and the users) from injury which can be caused by receiving a dangerous dose of radiation. [3,4] The materials used in a gamma radiation shield involves high atomic number (high Z) constituents like lead or bismuth. The detection and quanti- tative analysis of these high Z components in the gamma shielding material can be performed using XRF. Energy dispersive X-ray spectrometry (EDXRF) is an elemental analysis tech- nique with broad applications in science and industry. The elements present in a sample can be identified quantitatively by counting the number of photons of each energy emitted from the sample, when an individual atom (in the sample, used as target) is subjected to excitation by an external energy source, resulting in emission of X-ray photons of a characteristic energy or wavelength. Qualitative and quantitative determination of major, minor and trace elements can be done with the help of Energy Dispersive X-Ray Fluorescence (EDXRF) technique. For exam- ple, the elemental constituents of metals, alloys, glasses, cements, minerals rocks, ores, polymers and biomaterials have been determined using EDXRF. [5–10] The uniqueness of EDXRF is that it is non destructive technique; hence, it is widely applied to the study of arts, pottery, glasses, ceramics, coins paiting and icons. Composition of various materials such as semiconductor and solar cell devices can be determined. It is widely used in industry and other branches of technology. High Z elements can be satisfactorily determined using EDXRF. However, when the pure samples are analyzed without subjecting it to any of heat treatment, cleansing or mixing some other additives, elemental P. B. Hammannavar, B. Lobo Department of Physics Karnatak University’s Karnatak Science College, Dharwad 580001, Karnataka, India E-mail: blaise.lobo@gmail.com DOI: 10.1002/masy.201600212 Macromolecular Symposia Cobalt 57 www.ms-journal.de ARTICLE Macromol. Symp. 2017, 376, 1600212 © 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim 1600212 (1 of 5)