Citation: Kim, T.K.; Islam, A.B.M.H.;
Cha, Y.-J.; Oh, S.H.; Kwak, J.S.
Demonstration of Efficient Ultrathin
Side-Emitting InGaN/GaN Flip-Chip
Light-Emitting Diodes by Double
Side Reflectors. Nanomaterials 2022,
12, 1342. https://doi.org/10.3390/
nano12081342
Academic Editor: Antonio Di
Bartolomeo
Received: 22 March 2022
Accepted: 11 April 2022
Published: 13 April 2022
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nanomaterials
Article
Demonstration of Efficient Ultrathin Side-Emitting InGaN/GaN
Flip-Chip Light-Emitting Diodes by Double Side Reflectors
Tae Kyoung Kim
1,†
, Abu Bashar Mohammad Hamidul Islam
1,†
, Yu-Jung Cha
1
, Seung Hyun Oh
2
and Joon Seop Kwak
1,
*
1
Department of Energy Engineering, Korea Institute of Energy Technology, Naju-si 58330, Jeollanam-do, Korea;
tkkim@kentech.ac.kr (T.K.K.); abmhis@kth.se (A.B.M.H.I.); yjcha@kentech.ac.kr (Y.-J.C.)
2
Lumens Co Ltd., Yongin 446901, Gyeonggi-do, Korea; oh.dave@lumens.co.kr
* Correspondence: jskwak@kentech.ac.kr
† These authors contributed equally to this work.
Abstract: This work proposes an InGaN/GaN multiple-quantum-well flip-chip blue ultrathin side-
emitting (USE) light-emitting diode (LED) and describes the sidewall light emission characteristics
for the application of backlight units in display technology. The USE-LEDs are fabricated with
top (ITO/distributed Bragg reflector) and bottom (Ag) mirrors that cause light emission from the
four sidewalls in a lateral direction. The effect of light output power (LOP) on lateral direction is
consistently investigated for improving the optoelectronic performances of USE-LEDs. Initially, the
reference USE-LED suffers from very low LOP because of poor light extraction efficiency (LEE).
Therefore, the LEE is improved by fabricating ZnO nanorods at each sidewall through hydrothermal
method. The effects of ZnO nanorod lengths and diameters on LOP are systematically investigated
for optimizing the dimensions of ZnO nanorods. The optimized ZnO nanorods improve the LEE
of USE-LED, which thus results in increasing the LOP > 80% compared to the reference LED. In
addition, the light-tools simulator is also used for elucidating the increase in LEE of ZnO nanorods
USE-LED.
Keywords: light-emitting diodes; ultrathin side-emitting; ZnO; nanorods; light output power; light
extraction efficiency
1. Introduction
Nitride-based multiple-quantum-well (MQW) light-emitting diodes (LEDs) have been
applied for different kinds of commercial applications such as full-color displays, traffic
displays, indoor and outdoor lighting, automobiles, and backlight units of liquid crystal
displays (LCDs) because they are more reliable, efficient, cost effective, and have longer
life spans [1–5]. These applications require high light output power (LOP). Generally,
LOP decreases on account of low internal quantum efficiency (IQE) and light extraction
efficiency (LEE) caused by the high defect density and low light escaping probability since
80% of the emitted photons in a conventional lateral LED structure are totally reflected from
the interface of GaN-based epitaxial layer (n = 2.5) and air (n = 1), respectively. Various
research has been proposed for improving the device IQE [6–8]. On the other hand, the
patterned sapphire substrate (PSS) not only enhances the light-escaping probability but also
improves the crystal quality by reducing the threading dislocations [9]. The LEE of GaN-
based LEDs can also increase by designing bottom emission LEDs, especially vertical [10]
and flip-chip [11–13] LEDs because of the smaller difference in refractive indexes between
sapphire (n = 1.78) and air (n = 1).
Despite the limitation of LOP, the GaN-based LEDs are widely used in LCD technology
where a single LED works like a pointed light source that is then converted into a sheet light
source for an LCD backlight unit [14]. In addition, the solid-state based LCD technology
has gradually become mature because of extensive research in material, device innovation,
Nanomaterials 2022, 12, 1342. https://doi.org/10.3390/nano12081342 https://www.mdpi.com/journal/nanomaterials