1 Supporting Information Recoverable electrical breakdown strength and dielectric constant in ultra-low k nanolattice capacitors Min-Woo Kim, 1,† , Max L. Lifson, 2,† , Rebecca A. Gallivan 2 , Julia R. Greer, 2, * and Bong-Joong Kim, 1, * 1 School of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), Gwangju 61005, Korea 2 Division of Engineering and Applied Science, California Institute of Technology, Pasadena, CA 91125, United States * E-mail: jrgreer@caltech.edu and kimbj@gist.ac.kr † These authors have contributed equally to this work.