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Copyright: American Scientific Publishers
RESEARCH ARTICLE
Copyright © 2013 American Scientific Publishers
All rights reserved
Printed in the United States of America
Journal of
Nanoscience and Nanotechnology
Vol. 13, 6231–6235, 2013
Luminance Behavior of Lithium-Doped ZnO Nanowires
with p-Type Conduction Characteristics
Won Bae Ko
1
, Jun Seok Lee
1
, Sang Hyo Lee
1
, Seung Nam Cha
2
, Jung Inn Sohn
2
,
Jong Min Kim
2
, Young Jun Park
3
, Hyun Jung Kim
4
, and Jin Pyo Hong
1 ∗
1
Novel Functional Materials and Device Laboratory, Department of Physics,
Research Institute for Natural Science, Hanyang University,
Seoul 133-791, Korea
2
Department of Engineering Science, University of Oxford, Parks Road,
Oxford, OX1 3PJ, United Kingdom
3
Frontier Research Laboratory, Samsung Institute of Advanced Technology,
Yongin-si 446-712, Korea
4
Department of Semiconductor Science, Dongguk University, Seoul 100-715, Korea
The present study describes the room-temperature cathodeluminescence (CL) and temperature-
dependent photoluminescence (PL) properties of p-type lithium (Li)-doped zinc oxide (ZnO)
nanowires (NWs) grown by hydrothermal doping and post-annealing processes. A ZnO thin film
was used as a seed layer in NW growth. The emission wavelengths and intensities of undoped
ZnO NWs and p-type Li-doped ZnO NWs were analyzed for comparison. CL and PL observations
of post-annealed p-type Li-doped ZnO NWs clearly exhibited a dominant sharp band-edge emis-
sion. Finally, a n-type ZnO thin film/p-type annealed Li-doped ZnO NW homojunction diode was
prepared to confirm the p-type conduction of annealed Li-doped ZnO NWs as well as the structural
properties measured by transmission electron microscopy.
Keywords: Zinc Oxide, p-Type Characteristics, Lithium, Nanowires.
1. INTRODUCTION
The wide-bandgap semiconductor ZnO is increasingly
becoming a leading candidate for next generation opto-
and microelectronics due to its high exciton binding
energy, thermochemical stability, environmental compati-
bility, and potential applications for light-emitting devices
and photovoltaics.
1 2
However, the synthesis of a stable
and reproducible p-type ZnO material with satisfactory
concentration and high mobility still remains a challenging
problem.
The most often studied dopants are the group-V atoms:
N,
2
P,
3
As,
4
and Sb.
5 6
As an alternative, group-I dopants
have been proposed.
7–10
The difficulties in obtaining
p-ZnO have been recognized to be related to several
factors, such as limited dopant solubility, compensation
by native donors, and the unintentional incorporation of
hydrogen as a shallow donor. Simple theoretical calcu-
lations suggest that Li interstitials (Li
i
inside ZnO host
materials can behave as donors and also work as shallow
∗
Author to whom correspondence should be addressed.
acceptors on zinc sites (Li
Zn
.
11–13
In general, Li-doped
ZnO is highly resistive due to self-compensation and a
low energy barrier for Li to switch between interstitial and
substitutional sites. Previous analyses by other research
groups have indicated that Li concentration and the elec-
trical properties of the ZnO host material can be manip-
ulated by vacancy cluster gettering or high-temperature
treatments.
14 15
However, despite major progress over the last few years,
the understanding of the role of dopants and other impu-
rities, as well as of native defects, is still incomplete. The
effect of post-annealing on ZnO nanostructures has also
not yet been addressed in detail, even though recent studies
have suggested that post-annealing can raise the near-band
emission efficiency of ZnO films and nanostructures.
Cathodeluminescence (CL) and photoluminescence (PL)
are well known to excite individual nanosized materials
and are widely used to characterize their luminescence
properties. In particular, CL measurements provide use-
ful information regarding the excitation and de-excitation
mechanisms of doped-ZnO nanomaterials, as well as the
optimum acceleration range and current densities.
J. Nanosci. Nanotechnol. 2013, Vol. 13, No. 9 1533-4880/2013/13/6231/005 doi:10.1166/jnn.2013.7700 6231