LETTERS
PUBLISHED ONLINE: 20 JULY 2014 | DOI: 10.1038/NPHYS3004
Spin Hall effect tunnelling spectroscopy
Luqiao Liu
*
, Ching-Tzu Chen and J. Z. Sun
The spin Hall effect (SHE) and its inverse have been widely
used to generate and detect spin currents
1–8
. To date, most
experiments focus only on characterizing electrons near
the Fermi surface
4–8
, whereas the SHE, which originates
from the spin–orbit interaction, is expected to be energy
dependent
9,10
. Here, we report a tunnelling spectroscopy
technique developed to measure the SHE under finite bias
voltages. We studied the SHE for typical 5d transition metals.
At zero d.c. bias, the obtained spin Hall angles confirm
the results from spin-torque experiments
8,11–13
. At high bias,
the transverse spin Hall signals of these materials exhibit
very different voltage dependences. The SHE tunnelling
spectra have important implications in pinpointing the mech-
anisms of the SHE and provide guidelines for engineering
high-SHE materials. Moreover, SHE tunnelling spectroscopy
can be directly applied to two-dimensional surface states
with strong spin–orbit coupling, such as Dirac electrons in
topological insulators.
Tunnelling spectroscopy is one of the most widely used
experimental techniques to study electronic structures
14
.
Conventional tunnelling spectroscopy measures the longitudinal
tunnelling current to extract material parameters such as the
electronic density of states (DOS) and band gap. In this
Letter we show that by measuring the transverse current or
voltage generated from spin-polarized tunnelling carriers,
one can probe transport properties related to the spin–orbit
interaction, in particular the spin Hall effect. Furthermore, the
SHE signal from hot electrons can be detected by applying finite
bias voltages.
To inject spin polarized current into the normal metal (NM),
we pattern the NM/oxide/ferromagnet (FM) stacks into the shape
shown in Fig. 1a. We apply the charge current between leads 1 and
3 and measure the voltage between 2 and 4. In the presence of the
inverse SHE (ISHE), the spin angular momentum σ , injected spin
current density j
s
and generated charge current density j
c
satisfy the
relationship
3
j
c
∼ σ × j
s
. Therefore, a transverse voltage is expected
to arise in the y direction when spins aligned in-plane along the
x direction are injected into the NM and diffuse along the z axis
(Fig. 1b). At zero d.c. bias, the ISHE voltage of the device in Fig. 1a
can be written as
15,16
V
24
= ρθ
SH
j
s
a · (b/w) · (λ
sf
/t ) tanh(t /2λ
sf
) (see
also the Supplementary Information). Here ρ is the resistivity of
the spin Hall (SH) metal, θ
SH
is the SH angle, defined as the ratio
between the orthogonally related charge current density and the
spin current density, and j
s
= Pj
in
represents the spin current density,
where P and j
in
denote the spin polarization and injected charge-
current density. a, b, w and t are dimensions defined in Fig. 1a.
The shunting factors, b/w and (λ
sf
/t ) tanh(t /2λ
sf
), take into account
that the ISHE develops only in the region under the tunnel barrier
and decays over a thickness of λ
sf
whereas the charge current flows
across the entire channel cross-section of width w and thickness t .
As j
in
= I
13
/(ab), we arrive at the following expression for the
transverse resistance:
dV
24
dI
13
=
θ
SH
P ρ
w
·
λ
sf
t
· tanh(t /2λ
sf
) (1)
Figure 1d shows the circuit for detecting the transverse resistance
(Methods). Because of imperfect alignment in the photolithography,
there exists a parasitic voltage on top of the ISHE signal, which
we compensate with a resistance bridge. Because of its geometric
nature, the parasitic resistance remains constant with magnetic field,
and the SH resistance has been observed to be independent of its
sign or magnitude in all devices.
Figure 2a shows the ISH resistance (dV /dI )
13,24
curve of a
Ta/MgO/CoFeB sample. A hysteretic loop develops when we sweep
the magnetic field along the x direction (0
◦
), and vanishes when we
sweep along the y direction (90
◦
), consistent with the symmetry of
the ISHE. The coercivity of ∼20 Oe agrees with the switching field
of the CoFeB layer (Supplementary Information). Figure 2b shows
the transverse resistance (dV /dI )
24,13
measured in the direct SHE
(DSHE) configuration, in which we apply the current between leads
2 and 4 and measure the voltage between leads 1 and 3. We can
see that the magnitude of the signals agrees well between the DSHE
and ISHE configurations, as is expected from the Onsager reciprocal
relation. In the DSHE, the voltage across the barrier is induced by
spin accumulation at the Ta surface (see inset of Fig. 2b). Using
the model of ref. 15, we can write the DSHE-induced voltage as
V
13
= (θ
SH
P ρ λ
sf
/wt ) · I
24
tanh(t /2λ
sf
), the same as the ISHE equation
(Supplementary Information).
Figure 3a gives the ISHE data of a device with an AlO
x
tunnel
barrier (Ta/AlO
x
/CoFeB). At zero bias (black circles in Fig. 3a), the
magnitude of the signal is about half that of the MgO device (1.3 m
versus 2.6 m). This can be explained by the different values of spin
polarization across those two barriers. From the tunnelling magne-
toresistance (TMR) of standard magnetic tunnel junctions (MTJs)
made of these two barriers, we determined P (MgO) ∼ 0.60 ± 0.05
and P (AlO
x
) ∼ 0.38 ± 0.05 (Supplementary Information), roughly
consistent with the difference in the ISH resistances.
Besides Ta, we also measured samples made from Pt. Previous
studies showed that both metals have a strong SHE but their signs
are opposite
8,10,16
. As shown in Fig. 4a (ISHE) and 4b (DSHE),
the transverse resistances of the Pt/MgO/CoFeB sample indeed
exhibit opposite signs to those of the Ta samples. This fact also
indicates that the measured signal must originate from the NM
layer rather than from magneto-transport effects in the CoFeB layer,
which would have resulted in the same sign in transverse resistance
(Supplementary Information). To extract the SH angles, we note
that all the parameters in equation (1) can be determined relatively
precisely in our experiment except for λ
sf
. Large discrepancies
exist in the values of λ
sf
reported from different experiments. To
IBM TJ Watson Research Center, Yorktown Heights, New York 10598, USA. *e-mail: lliu@us.ibm.com
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