Vol.:(0123456789) 1 3 Journal of Materials Science: Materials in Electronics https://doi.org/10.1007/s10854-018-8919-1 Recent developments in the texture analysis program ANAELU Diana C. Burciaga‑Valencia 1  · Edgar E. Villalobos‑Portillo 1  · José A. Marín‑Romero 2  · Manuel Sánchez del Río 3  · María E. Montero‑Cabrera 1  · Luis E. Fuentes‑Cobas 1  · Luis Fuentes‑Montero 4 Received: 23 November 2017 / Accepted: 14 March 2018 © Springer Science+Business Media, LLC, part of Springer Nature 2018 Abstract The ANAELU program is part of the current trend towards 2D difraction patterns processing. ANAELU is open source, distributed under MPL license. The basic conception of the program is that the user proposes the crystalline structure of the phase under study and the inverse pole fgure of the considered texture. With this data, using the tools of mathematical texture analysis, the program simulates and graphically represents the 2D-XRD pattern of the model sample. An important feature of the considered patterns is the distribution of intensities along the Debye rings. The visual comparison between observed and calculated patterns is the criterion of correctness of the proposed model. The program has been successfully used in the characterization of materials for electronic applications, alloys and minerals. Some limitations that have been detected in the use of ANAELU are the limited number of input formats that it is able to read, the program relative slowness, the non- consideration of the difraction background and the poor portability. The present update consists in the improvement of the raised aspects. ANAELU-2.0 presents the following innovations. (a) A new GUI has been created, in WxPython, associated with a system for reading experimental patterns through the FabIO library. The current system reads patterns in the most internationally used formats. (b) The calculation of difraction patterns, from the generation of the unit cell to the difracted intensities, has been translated to FORTRAN 2003 with systematic use of the CRYSFML library. This change reduces the running time by one order. (c) Various routines (Laplacian softening, spherical harmonics) have been introduced to model the two-dimensional background. (d) The current version, ANAELU2.0, can be distributed by means of stable executable packages in Windows, LINUX and IOS wraped by MiniConda. 1 Introduction: the ANAELU program Crystallographic texture plays signifcant roles in the proper- ties of materials. The texture of rocks [1, 2], alloys [3–5] and materials from biology [6, 7] is studied for its relevance both for basic knowledge and for technological implications. In the particular feld of materials for electronic applications, texture is a decisive factor in the optimization of the proper- ties of magnetic memories [8, 9], photo-voltaic devices [10], piezoelectric [11] and magneto-electric transducers [12, 13], among others. The development of trustable methods for texture analysis is a general need in materials science and particularly in electronics. The improvement and relative proliferation of two-dimensional X-ray detectors [14, 15] are leading to a sustained increase of so-called two-dimen- sional difraction (2D-XRD) and scattering investigations in materials science and related disciplines [16–18]. The book by He [19] and the program by Hammersley [20] are two acknowledged references in the 2D-XRD feld. The use of digital 2D-XRD for texture analysis is a relatively young ten- dency. In this line of work, the software package ANAlytical Emulator Laue Utility (ANAELU) has recently introduced [21] an efective method for the interpretation of 2D-XRD patterns produced by axially-textured samples. Here we present ANAELU 2.0, an upgraded version of the mentioned program. The work cycle from the frst ver- sion (ANAELU 1.0 in what follows) to the present one is described with the help of Fig. 1, linked with a case study from the literature [22]. Figure 1a shows the experimental * Luis Fuentes-Montero luis.fuentes-montero@diamond.ac.uk 1 Advanced Materials Research Center, 31136 Chihuahua, Mexico 2 Department of Applied Physics, CINVESTAV IPN Unidad-Mérida, 97310 Mérida, Mexico 3 European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000 Grenoble, France 4 Diamond Light Source Ltd, Harwell Science and Innovation Campus, Didcot OX11 0DE, UK