Accurate Spectrophotometric Method for Semitransparent Metallic Thin-ｦlm Index Determination Using Interference Enhancement Riley Shurvinton (  clshurv@gmail.com ) Institut Fresnel Marseille https://orcid.org/0000-0001-5122-0693 Fabien Lemarchand Institut Fresnel Marseille Antonin Moreau Institut Fresnel Marseille Julien Lumeau Institut Fresnel Marseille Research Keywords: spectrophotometry, index determination, absorbing layers, titanium Posted Date: July 23rd, 2021 DOI: https://doi.org/10.21203/rs.3.rs-660206/v1 License:   This work is licensed under a Creative Commons Attribution 4.0 International License. Read Full License