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Transactions on Magnetics
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1
Large negative uniaxial magnetic anisotropy in epitaxially strained
nickel ferrite films
Mitsuharu Matsumoto
1
, Sonia Sharmin
1
, Jun-ichiro Inoue
1
, Eiji Kita
1
, and Hideto Yanagihara
1
1
University of Tsukuba, Tsukuba, Ibaraki 305, Japan
We investigated the magnetic properties of NiFe2O4(NFO) epitaxial films grown on MgAl2O4(MAO) substrates by a reactive RF
magnetron sputtering method. The films were found to be coherently distorted to at least 61 nm thickness because of the lattice mismatch
between MAO and NFO. The NFO(001) films exhibited large negative uniaxial anisotropy that can be quantitatively explained by the
magneto-elastic theory despite the lattice distortion being as much as 3%. We also discovered magnetic anomalies in both the saturation
magnetization and anisotropy of the thinnest film, which may because of the reconstruction of the electronic structures at NFO interfaces.
Index Terms—NiFe2O4 epitaxial thin film, magneto-elastic effect, magnetic uniaxial anisotropy.
I. INTRODUCTION
agnetic anisotropy is one of the most important properties
of ferromagnetic materials, generally originating from
low symmetry of local or entire structure. In a form of epitaxial
thin films, a uniaxial lattice distortion can be easily introduced
into the film through a lattice misfit. Therefore, some volume
of the film adjacent to a substrate suffers from compressive or
tensile stress depending on a sign of the lattice misfit. The
lattice strain gives rise to an anisotropic magnetoelastic effect
[1][2]. Thus, epitaxial mismatch is a promising way to induce
a large uniaxial magnetic anisotropy in epitaxial films.
Spinel ferrites are magnetic oxides which have been actively
investigated from the viewpoints of both fundamental research
and application[3][4]. Since the crystal symmetry of a spinel
structure is cubic, large magnetic anisotropy is not expected for
most spinel ferrites in bulk form. The chemical formula of
spinel ferrite is described as MFe2O4 where M stands for metal
ions such as Fe, Co, Ni, Zn etc. M and Fe ions occupy two
crystallographically inequivalent sites.
In the case of nickel ferrite(M=Ni; NFO), the octahedral sites
(B-sites) are randomly occupied by equal numbers of Ni
2+
and
Fe
3+
. On the other hand, the tetrahedral sites (A-sites) are
occupied by only Fe
3+
. The Fe
3+
ions have electronic
configuration of d
5
meaning that the electron distribution is
spherical and therefore the magnetic properties are isotropic. In
the case of Ni
2+
(d
8
), since the three t2g levels of the minority
spin band are fully occupied, large magnetic anisotropy cannot
be expected. However, once the crystal lattice is deformed via
uniaxial strain such as an epitaxial distortion, uniaxial magnetic
anisotropy can be potentially induced[5].
Recently, we have discovered that NFO(001) films grown on
MgAl2O4 (MAO) substrate by reactive sputtering exhibit a
saturation magnetization comparable to that of bulk NFO[5] .
MAO has a similar spinel crystal structure with a smaller lattice
constant (a = 0.808 nm) than that of NFO (a = 0.834 nm) and
therefore both suppression of anti-phase domain density[6] and
large compressive epitaxial stress are to be expected if NFO thin
films are grown on a substrate of an MAO single crystal.
In this paper, we report that negative uniaxial magnetic
anisotropy ( ܭ
) is induced by epitaxial strain for NFO film
grown on MAO(001). The absolute value for the largest
induced magnetic anisotropy exceeds 10 Merg/cm
3
.
II. EXPERIMENT
All films were grown by using a high-vacuum planar-type
magnetron sputtering system. Reactive sputtering was
performed by introducing both Ar and O
2
in a radio frequency
(RF) sputtering mode. The sputtering target was a Fe-Ni alloy
with an atomic composition of Fe/Ni=2:1[5]. Prior to the
sputtering process, polished MAO(001) substrates were
annealed at 1200°C for 6 hours in an atmosphere. After the
substrates were introduced into a growth chamber, the
substrates were annealed at 400°C for approximately 20
minutes in vacuum. Growth temperature of NFO epitaxial films
were 300°C. Thickness of the fabricated films ranged from 4
nm to 61 nm.
We confirmed the epitaxial growth and the crystal structure
of the NFO films by using reflected high energy electron
diffraction (RHEED) technique and an X-ray diffraction (XRD)
method. Some of the XRD experiments were performed at BL-
4C of Photon Factory in KEK. The film thicknesses were
determined by X-ray reflectivity (XRR). Surface morphology
of the films was observed by atomic force microscopy (AFM).
Magnetization and magnetic torque measurements were
performed at room temperature using respectively a SQUID
magnetometer and a PPMS with a torque magnetometer option.
M
Fig. 1. AFM images of (a) MAO(001) and (b)-(f) NFO(001) with
different thicknesses.