182 doi:10.1017/S1431927618013260 Microsc. Microanal. 24 (Suppl 2), 2018 © Microscopy Society of America 2018 1D-Full Field Microscopy of Elastic and Inelastic Scattering with Transmission off- axis Fresnel Zone Plates F. Döring 1* , F. Marschall 1 , Z. Yin 2,4 , B. Rösner 1 , M. Beye 2 , P. Miedema 2 , K. Kubiček 2 , L. Glaser 2 , D. Raiser 4 , J. Soltau 3 , V.A. Guzenko 1 , J. Viefhaus 2 , J. Buck 2 , M. Risch 3 , S. Techert 2, 3, 4 and C. David 1 1. Paul Scherrer Institut, Villigen-PSI, 5232, Switzerland 2. Deutsches Elektronen-Synchrotron DESY, Photon Science, Hamburg, 22607, Germany 3. Georg-August-Universität, Göttingen, 37077, Germany 4. Max Planck Institute for Biophysical Chemistry, Göttingen, 37077, Germany * Corresponding author, florian.doering@psi.ch Resonant inelastic X-ray scattering (RIXS) is a powerful X-ray spectroscopy technique capable of investigating electronic properties of materials and molecules. Using soft X-rays, it becomes especially sensitive to the electronic structure of matter due to sharp transitions [1]. Combining this successful technique with imaging opens up a variety of new possibilities for sample characterization because electronic information can be obtained with spatial resolution. This allows for investigations of inhomogeneous materials including interfaces and defects. Conventional RIXS instrumentation relies on reflecting gratings for analyzing the emitted light from the sample by dispersing it across a detector. For RIXS imaging this requires a time-consuming point by point raster scan of the sample in order to finally obtain a complete image of the sample with the corresponding spectroscopic information [2]. We report on the use of a new zone plate based RIXS analyzer scheme, which has already been successfully tested for RIXS imaging [3]. An off axis part of a Fresnel zone plate (FZP) is used as analyzer and replaces the conventional reflection grating. This setup exploits the fundamental advantage of an X-ray optic that has imaging capabilities. While dispersing the emitted light across one axis of the detector, it acts as a focusing element for the other axis, making it possible to combine 1D microscopy with spectroscopy (e.g. RIXS). Moreover and in contrast to point by point scans (necessary for conventional RIXS setups), line by line scans allow for a much higher throughput. This concept was applied to a Siemens star test sample with 500 μm diameter made from SiO 2 on an iridium-coated silicon substrate. The sample was scanned in 82 steps using a 1 mm long x-ray line focus having a width of down to 10 μm and a photon energy of around 550 eV. At each step, a line of the sample was imaged onto the detector and its corresponding energy dispersion was recorded (Fig. 1a). Here, the zone plate analyzer was focused on the elastic line of the emission ensuring that this will give a sharp detector image. Combining these 82 slices of the sharp elastic line allows for reconstructing the RIXS image of the Siemens Star test pattern (Fig. 1b). The upgrade of this analyzer scheme in terms of instrumentation was the parallel usage of a second off axis FZP, which makes it possible to focus a second energy from the sample to the detector. The second FZP can be moved individually from the first one, which allows for two-color spectroscopy combined with imaging. Here, contributions of two different emitted X-ray energies produce a sharp image on the detector. This scheme, which is sketched in Fig 2, was successfully implemented and tested at the P04 beamline at PETRA III (DESY). With this advanced analyzer scheme, not only elastic and inelastic scattering information at two energies can be detected but also two times the solid angle of radiation is https://doi.org/10.1017/S1431927618013260 Downloaded from https://www.cambridge.org/core. IP address: 192.126.205.106, on 25 Apr 2020 at 11:46:51, subject to the Cambridge Core terms of use, available at https://www.cambridge.org/core/terms.