Atomic structure of the Si113-3 1 surface: Charge transfer within tetramers C. C. Hwang Department of Physics, Sung Kyun Kwan University, Suwon 440-746, Korea and Institute of Basic Science, Sung Kyun Kwan University, Suwon 440-746, Korea H. S. Kim, Y. K. Kim, and J. S. Kim Department of Physics, Sung Kyun Kwan University, Suwon 440-746, Korea C. Y. Park Department of Physics, Sung Kyun Kwan University, Suwon 440-746, Korea and Institute of Basic Science, Sung Kyun Kwan University, Suwon 440-746, Korea K. J. Kim, T.-H. Kang, and B. Kim Pohang Accelerator Laboratory, Pohang 790-784, Korea Received 1 October 1998; revised manuscript received 10 March 1999 Atomic structure of the Si(113)3 1 surface was investigated by using synchrotron radiation photoemission spectroscopy. The Si 2 p core-level spectra were measured at surface-sensitive photon energy, 132 eV. From the fitting of the Si 2 p core-level spectrum for the Si(113)3 1 surface, three surface components were resolved at binding energies of about 0.745, -0.554, and 0.34 eV, respectively. The fitting results show that the dimers receive about 0.16 electrons and the rest of tetramers donate about 0.22 electrons on the Si(113)3 1 surface. This strongly supports the fact that the dimers and the rest of the tetramers are relaxed upward and downward, respectively, on Ranke’s model. S0163-18299902424-8 Reconstructions of silicon surfaces have been widely studied until now. It is well known that Si100and Si111 surfaces are reconstructed to 2 1 and 7 7 surfaces. 1,2 These reconstructions are well understood within the dimer 3 and the dimer-adatom-stacking fault DASRef. 2models, respectively. From theoretical and experimental studies on low index Si100, Si111surfaces, the lowering of surface energy is related to several factors; dimers and adatoms tend to be the main building blocks of reconstructed surfaces to reduce dangling-bond density and the surface orbitals have a tendency to be rehybridized from sp 3 toward sp 2 and s 2 p 3 -like configurations, as observed in asymmetric dimers of the Si(100)2 1 surface. 3 As with low-index silicon sur- faces, the bulk-truncated Si113surfaces in Fig. 1aare also reconstructed to minimize their surface energy. 4–10 Si(113)3 1 Refs. 4–6or 3 2 Refs. 7–10reconstruc- tions were reported by using several surface-sensitive tech- niques such as low energy electron diffraction LEEDand scanning tunneling microscopy STM. For the Si(113)3 1 surface, several structural models have been suggested, such as Ranke’s ‘‘dimer and adatom’’ model with a symmet- ric or asymmetric dimer, 4 Dabrowski’s model, 9 and the puckering model. 11 However, the detailed atomic structure of the Si(113)3 1 surface is not solved completely. On the other hand, Ranke suggested that rehybridization from sp 3 toward sp 2 and s 2 p 3 -like configurations induced by the sur- face reconstruction may stabilize the structures of the Si113 surface. 4 It seems that several theoretical studies have sug- gested that the rehybridization can occur for the reconstruc- tion of the Si113surface. 11–14 In the experimental point of view, Hadley et al. gave a similar argument for the Si(113)3 1 surface based on STM results. 6 However, the rehybridized surface atoms could not be resolved clearly in their STM images. It is still unclear whether the Si(113)3 1 surface is rehybridized to stabilize the structure or not. Therefore, we have investigated the detailed atomic structure and the orbital rehybridization on the Si(113)3 1 surface. The experiment was performed in an ultrahigh-vacuum chamber with a base pressure of about 1.410 -9 Pascal at the beam line 2B1 of the Pohang Light Source PLSin Korea. 15 All spectra shown in this paper were obtained using a spherical grating monochrometer and an angle-integrated concentric hemispherical electrostatic analyzer with five channeltrons VSW2A125. The total energy resolution at the photon energy of about 132 eV and the acceptance angle of the spectrometer were about 0.1 eV and 11.4°, respec- tively. The angle between the incident photon beam and the direction of the detected photoelectrons was about 40°. A well-defined n-type Si113wafer was etched and preoxi- dized chemically according to Shiraki’s method 16 before put- ting it into the chamber. The sample was resistively heated to about 1200 °C several times to make a clean surface. We observed the 3 2 LEED pattern for the clean Si113sur- face at room temperature RT, in which 2 spots were broader and weaker than those with the 3 1 periodicity. This result is consistent with a previous result. 7 It was ob- served from STM works that the 3 1 exists locally within the large 3 2 surface at RT. 8,9 The 3 2 surface was re- ported to be easily transformed to the 3 1 surface at a sub- strate temperature of about 450 °C. 7 These results indicate that both surfaces have very close surface energy. Similarly, Si(111)5 5 and 7 7 surfaces are known to have close surface energy. As with the formation of the Si(111)5 5 phase upon Si homoepitaxial growth on the Si(111)7 7 PHYSICAL REVIEW B 15 JUNE 1999-I VOLUME 59, NUMBER 23 PRB 59 0163-1829/99/5923/148644/$15.00 14 864 ©1999 The American Physical Society