Atomic structure of the Si„113…-„ 3 1 … surface: Charge transfer within tetramers
C. C. Hwang
Department of Physics, Sung Kyun Kwan University, Suwon 440-746, Korea
and Institute of Basic Science, Sung Kyun Kwan University, Suwon 440-746, Korea
H. S. Kim, Y. K. Kim, and J. S. Kim
Department of Physics, Sung Kyun Kwan University, Suwon 440-746, Korea
C. Y. Park
Department of Physics, Sung Kyun Kwan University, Suwon 440-746, Korea
and Institute of Basic Science, Sung Kyun Kwan University, Suwon 440-746, Korea
K. J. Kim, T.-H. Kang, and B. Kim
Pohang Accelerator Laboratory, Pohang 790-784, Korea
Received 1 October 1998; revised manuscript received 10 March 1999
Atomic structure of the Si(113)3 1 surface was investigated by using synchrotron radiation photoemission
spectroscopy. The Si 2 p core-level spectra were measured at surface-sensitive photon energy, 132 eV. From
the fitting of the Si 2 p core-level spectrum for the Si(113)3 1 surface, three surface components were
resolved at binding energies of about 0.745, -0.554, and 0.34 eV, respectively. The fitting results show that
the dimers receive about 0.16 electrons and the rest of tetramers donate about 0.22 electrons on the
Si(113)3 1 surface. This strongly supports the fact that the dimers and the rest of the tetramers are relaxed
upward and downward, respectively, on Ranke’s model. S0163-18299902424-8
Reconstructions of silicon surfaces have been widely
studied until now. It is well known that Si100 and Si111
surfaces are reconstructed to 2 1 and 7 7 surfaces.
1,2
These reconstructions are well understood within the dimer
3
and the dimer-adatom-stacking fault DASRef. 2 models,
respectively. From theoretical and experimental studies on
low index Si100, Si111 surfaces, the lowering of surface
energy is related to several factors; dimers and adatoms tend
to be the main building blocks of reconstructed surfaces to
reduce dangling-bond density and the surface orbitals have a
tendency to be rehybridized from sp
3
toward sp
2
and
s
2
p
3
-like configurations, as observed in asymmetric dimers
of the Si(100)2 1 surface.
3
As with low-index silicon sur-
faces, the bulk-truncated Si113 surfaces in Fig. 1a are
also reconstructed to minimize their surface energy.
4–10
Si(113)3 1 Refs. 4–6 or 3 2 Refs. 7–10 reconstruc-
tions were reported by using several surface-sensitive tech-
niques such as low energy electron diffraction LEED and
scanning tunneling microscopy STM. For the Si(113)3
1 surface, several structural models have been suggested,
such as Ranke’s ‘‘dimer and adatom’’ model with a symmet-
ric or asymmetric dimer,
4
Dabrowski’s model,
9
and the
puckering model.
11
However, the detailed atomic structure of
the Si(113)3 1 surface is not solved completely. On the
other hand, Ranke suggested that rehybridization from sp
3
toward sp
2
and s
2
p
3
-like configurations induced by the sur-
face reconstruction may stabilize the structures of the Si113
surface.
4
It seems that several theoretical studies have sug-
gested that the rehybridization can occur for the reconstruc-
tion of the Si113 surface.
11–14
In the experimental point of
view, Hadley et al. gave a similar argument for the
Si(113)3 1 surface based on STM results.
6
However, the
rehybridized surface atoms could not be resolved clearly in
their STM images. It is still unclear whether the Si(113)3
1 surface is rehybridized to stabilize the structure or not.
Therefore, we have investigated the detailed atomic structure
and the orbital rehybridization on the Si(113)3 1 surface.
The experiment was performed in an ultrahigh-vacuum
chamber with a base pressure of about 1.410
-9
Pascal at
the beam line 2B1 of the Pohang Light Source PLS in
Korea.
15
All spectra shown in this paper were obtained using
a spherical grating monochrometer and an angle-integrated
concentric hemispherical electrostatic analyzer with five
channeltrons VSW2A125. The total energy resolution at
the photon energy of about 132 eV and the acceptance angle
of the spectrometer were about 0.1 eV and 11.4°, respec-
tively. The angle between the incident photon beam and the
direction of the detected photoelectrons was about 40°. A
well-defined n-type Si113 wafer was etched and preoxi-
dized chemically according to Shiraki’s method
16
before put-
ting it into the chamber. The sample was resistively heated to
about 1200 °C several times to make a clean surface. We
observed the 3 2 LEED pattern for the clean Si113 sur-
face at room temperature RT, in which 2 spots were
broader and weaker than those with the 3 1 periodicity.
This result is consistent with a previous result.
7
It was ob-
served from STM works that the 3 1 exists locally within
the large 3 2 surface at RT.
8,9
The 3 2 surface was re-
ported to be easily transformed to the 3 1 surface at a sub-
strate temperature of about 450 °C.
7
These results indicate
that both surfaces have very close surface energy. Similarly,
Si(111)5 5 and 7 7 surfaces are known to have close
surface energy. As with the formation of the Si(111)5 5
phase upon Si homoepitaxial growth on the Si(111)7 7
PHYSICAL REVIEW B 15 JUNE 1999-I VOLUME 59, NUMBER 23
PRB 59 0163-1829/99/5923/148644/$15.00 14 864 ©1999 The American Physical Society