Poster paper Development and performance of a versatile soft X-ray polarimeter H. WANG 1 † , U. H. WAGNER 1 , S. S. DHESI 1 , K. J. S. SAWHNEY 1 , F. MACCHEROZZI 1 , G. VAN DER LAAN 1 , M. A. MACDONALD 2,3 , I. B. POOLE 2 , F. M. QUINN 2 AND C. J. LATIMER 4 1 Diamond Light Source, Didcot OX11 0DE, UK 2 STFC Daresbury Laboratory, Warrington WA4 4AD, UK 3 Canadian Light Source Inc., 101 Perimeter Road, Saskatoon, Saskatchewan SK S7N OX4, Canada 4 Queen’s University Belfast, Northern Ireland BT7 1NN, UK (Received 14 June 2010; revised 16 August 2010; accepted 29 September 2010) With modern undulators generating light of an arbitrary polarization state, exper- iments exploiting this feature in the soft X-ray region are becoming increasingly widespread. Circularly polarized light in the soft X-ray region is of particular inter- est to investigate of magnetic metals such as Fe, Co and Ni, and the rare earths. A versatile multilayer polarimeter has been designed and developed to characterize the polarization state of the soft X-ray beam. A W/B 4 C multilayer transmission phase retarder and reflection analyser has been used for polarimetry measurements on the beamline (I06) at Diamond Light Source. The design details of the polari- meter and preliminary polarimetry results are presented. 1. Introduction and alignment of the polarimeter Soft X-ray (SXR) synchrotron radiation with variable polarization is widely used to study the properties of matter. Knowledge of the degree of polarization in the experiment is of utmost importance for many applications. Several SXR polari- meters have been developed and commissioned for use at synchrotron radiation facilities (Schaefer et al. 1999; Imazono, Sano & Suzuki 2009). A high-precision and versatile multilayer polarimeter for the SXR region has been designed for the Diamond Light Source (DLS) user community (Wagner et al. 2009). The polarimeter has its own independent control system and is portable so that it can be moved with relative ease between different beamlines and synchrotron facilities. A polarization measurement requires the independent rotations of the multilayer polarizer (α) and analyser (β) about the optical axis of the photon beam in the SXR region (Wagner et al. 2009), and an achromatic phase shifter based on a W/B 4 C transmission multilayer has been developed for extreme ultraviolet (XUV) wide- band polarization measurements at the magnetic 2p edges of Fe, Co and Ni † Email address for correspondence: Hongchang.Wang@diamond.ac.uk Diamond Light Source Proceedings, Vol 1, e116, page 1 of 4 © Diamond Light Source Ltd 2010 SRMS-7 2010 doi:10.1017/S204482011000050X https://www.cambridge.org/core/terms. https://doi.org/10.1017/S204482011000050X Downloaded from https://www.cambridge.org/core. IP address: 207.241.231.81, on 28 Jul 2018 at 13:29:33, subject to the Cambridge Core terms of use, available at