Author’s Accepted Manuscript Influence of the gate and dielectric thickness on the electro-optical performance of SRO-based LECs: Resistive switching, IR and deep UV emission S.A. Cabañas-Tay, L. Palacios-Huerta, M. Aceves- Mijares, J. Alvarez-Quintana, S.A. Pérez-García, C. Domínguez-Horna, A. Morales-Sánchez PII: S0022-2313(17)30453-2 DOI: http://dx.doi.org/10.1016/j.jlumin.2017.08.034 Reference: LUMIN14977 To appear in: Journal of Luminescence Received date: 17 March 2017 Revised date: 16 August 2017 Accepted date: 18 August 2017 Cite this article as: S.A. Cabañas-Tay, L. Palacios-Huerta, M. Aceves-Mijares, J. Alvarez-Quintana, S.A. Pérez-García, C. Domínguez-Horna and A. Morales- Sánchez, Influence of the gate and dielectric thickness on the electro-optical performance of SRO-based LECs: Resistive switching, IR and deep UV e m i s s i o n , Journal of Luminescence, http://dx.doi.org/10.1016/j.jlumin.2017.08.034 This is a PDF file of an unedited manuscript that has been accepted for publication. As a service to our customers we are providing this early version of the manuscript. The manuscript will undergo copyediting, typesetting, and review of the resulting galley proof before it is published in its final citable form. Please note that during the production process errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal pertain. www.elsevier.com/locate/jlumin