Journal Pre-proof A Novel Dice Similarity Measure for IFSs and its Applications in Pattern and Face Recognition Akanksha Singh , Sanjay Kumar PII: S0957-4174(20)30071-3 DOI: https://doi.org/10.1016/j.eswa.2020.113245 Reference: ESWA 113245 To appear in: Expert Systems With Applications Received date: 7 August 2019 Revised date: 14 January 2020 Accepted date: 24 January 2020 Please cite this article as: Akanksha Singh , Sanjay Kumar , A Novel Dice Similarity Measure for IFSs and its Applications in Pattern and Face Recognition, Expert Systems With Applications (2020), doi: https://doi.org/10.1016/j.eswa.2020.113245 This is a PDF ﬁle of an article that has undergone enhancements after acceptance, such as the addition of a cover page and metadata, and formatting for readability, but it is not yet the deﬁnitive version of record. This version will undergo additional copyediting, typesetting and review before it is published in its ﬁnal form, but we are providing this version to give early visibility of the article. Please note that, during the production process, errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal pertain. © 2020 Published by Elsevier Ltd.