ISSN 1063-7834, Physics of the Solid State, 2011, Vol. 53, No. 4, pp. 810–814. © Pleiades Publishing, Ltd., 2011.
Original Russian Text © E.S. Zhukova, N.P. Aksenov, B.P. Gorshunov, Yu.G. Selivanov, I.I. Zasavitskii, D. Wu, M. Dressel, 2011, published in Fizika Tverdogo Tela, 2011, Vol. 53,
No. 4, pp. 755–759.
810
1. INTRODUCTION
The properties exhibited by europium chalco-
genides EuX (X = O, S, Se, Te), which form a separate
class of magnetic semiconductors, are adequately
described in the literature [1–3]. Currently, they
become of interest again in connection with the use of
solid solutions on their base for the design of semicon-
ductor heterostructures with effective electron and
optical confinement [4–6] and the fabrication of
highly reflecting Bragg mirrors [7] in mid-infrared
(IR) spectral region. Such mirrors have been used to
develop both IR lasers with vertical emission output
(VCSEL, vertical cavity surface emitting laser) [7] and
highly selective IR detectors (RCED, resonant cavity
enhanced detector) [8].
Data on the optical properties of the Pb
1– x
Eu
x
Te
solid solutions are very scarce. First measurements of
photoluminescence of the Pb
1– x
Eu
x
Te solid solution
[4] showed that band gap E
g
of the compound abruptly
and nonlinearly increases as the Eu content increases.
Dispersion of the absorption and refraction index in
Pb
1 x
Eu
x
Te (0 < x < 0.05) at energies above and below
E
g
(E
g
/hc ~ 1000–5000 cm
–1
, c is the velocity of light,
and h is the Plank constant) and at low temperatures
(5–300 K) was studied in [9]. Using the technique of
inclined incidence when measuring the transmission
spectra, Aigle et al. [10] concluded that the
Pb
1 x
Eu
x
Te solid solution manifests a dual-mode
behavior with a local mode of Eu in PbTe at 127 cm
–1
.
They also determined energies of optical phonons in
EuTe at 5 K.
In order to obtain a detailed information about
interactions of Eu ions located in the crystal matrix of
the IV–VI semiconductor, further optical measure-
ments in the mid-IR and far-IR spectral regions
should be performed. We originally measured the
transmission spectra of epitaxial layers of the
Pb
1 x
Eu
x
Te solid solution grown on the BaF
2
and Si
substrates in a wide frequency range at temperatures
from room temperature to liquid-helium temperature.
2. SAMPLE PREPARATION
AND EXPERIMENTAL TECHNIQUE
Single-crystal Pb
1– x
Eu
x
Te (0 ≤ x ≤ 0.37) layers
were grown by molecular beam epitaxy [11] on cleaved
insulating BaF
2
substrates. Selection of these sub-
strates is caused by the fact that BaF
2
and lead–
europium chalcogenides have close linear thermal
expansion coefficients, which allows us to repeatedly
cool samples to low temperatures. However, BaF
2
is
characterized by strong phonon and impurity absorp-
tion in a range of 100–600 cm
–1
, which makes the
measurements of transmittance of the layers in this
spectral range impossible. Therefore, for the composi-
tion with x = 0.07, we grew layers on a high-resistivity
(ρ ~ 50 kΩ cm) Si(111) substrate with CaF
2
/BaF
2
buffer layers
1
according to technology described in
1
Silicon substrates with CaF
2
/BaF
2
buffer layers were fabricated
at the Institute of Electronic Engineering and Industrial Tech-
nologies, Academy of Sciences of Moldova.
OPTICAL
PROPERTIES
Transmission Spectra of Epitaxial Layers
of Pb
1– x
Eu
x
Te (0 ≤ x ≤ 0.37) Solid Solutions
in the Frequency Range 7–4000 cm
–1
E. S. Zhukova
a,
*, N. P. Aksenov
a
, B. P. Gorshunov
a
, Yu. G. Selivanov
b
,
I. I. Zasavitskii
b
, D. Wu
c
, and M. Dressel
c
a
Prokhorov General Physics Institute, Russian Academy of Sciences, ul. Vavilova 38, Moscow, 117942 Russia
* e-mail: zhukovaelenka@gmail.com
b
Lebedev Physical Institute, Russian Academy of Sciences, Leninskii pr. 53, Moscow, 119991 Russia
c
Physikalisches Institut, Universität Stuttgart, Pfaffenwaldring 57, Stuttgart, D-70550 Germany
Received July 15, 2010; in final form, September 30, 2010
Abstract—The spectra of epitaxial Pb
1– x
Eu
x
Te (0 ≤ x ≤ 0.37) solid solution layers grown on BaF
2
and Si sub-
strates have been investigated over a wide frequency range 7–4000 cm
–1
at temperatures of 5–300 K. Apart
from the phonon and impurity absorption lines, the absorption in a local mode in PbEuTe layers of substrates
and buffer layers has been observed in the frequency range 110–114 cm
–1
. As the temperature decreases from
300 to 5 K, the transverse phonon mode softens from 33.0 to 19.5 cm
–1
.
DOI: 10.1134/S1063783411040342